회원등록 비번분실
제품소개



 Product info...
Profiler(Alpha-Step)
   
NanoMap-1000WLI
3D Non Contact Optical Surface Profilometer
 
NanoMap-1000WLI Specification : 
- Scanning Mode : PSI & WLI
- Scan Speed : 3.75 to 26um/sec(software selectable)
- Vertical Resolution : 0.01 Angstron(0.001nm)
- Vertical Range : Max 20mm
- RMS Repeatability : 0.2 Angstron(0.02nm)
- Sample Reflectivity : 0.4% to 100%
- Step Height Repeatability : 0.1% or 0.1nm 1sigma
- Stage Moving : X,Y Motorized 150 x 150mm(up to 620mm available)
- Z Stage Moving : Motorized up to 100mm
- Sample Rotation : 360 degree 
- Sample Tilt : 8 degree
- Sample Platform : STD(150mm),(optional up to 620mm)
- Calibration STD : 500nm & 100um
 
  첨부파일: NanoMap-1000WLI Brochure 11-12.pdf(719.3KB)
 
 


홈으로/HOME Copyrightⓒ1999-2009 HTSKOREA (www.htskore.com) all right reserved
경기도 수원시 영통구 태장로 54번길 60, 3층(수원시 영통구 망포동 649-24번지 3층)
TEL:031-273-2438(代) / FAX:031-273-2439 / E-Mail: htskorea@htskorea.com