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NSOM/NSOM Probes
   
TriA SNOM
Scanning Near Field Optical Microscope
 
The invention and subsequent development of scanning probe microscopy (SPM) methods have produced the necessary tools for a step forward in optical measurements.
The possibility to go beyond the Abbe diffraction limit has been achieved with the Near-field light optical microscopes (SNOM). They employ SPMs precision of piezoelectric raster-scanning together with sharp probes to obtain light optical images at subwavelength resolution.
Particular care has been taken to different applications from solid state to biomedicine.
The goal of our company is to give to the customers the instrument that best fit their needs.
This product is the result of a collaboration between A.P.E. Research and National Research centers.
Brochure_TriA-SNOM_2009.pdf(344KB)


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