||Atomic Force Microscope
APE Research AFM series are a compact and versatile scanning probe microscope (SPM) platforms capable to meet the diverse functional needs of AFM/SPM users. The integrated combination of different characterization systems in one stage system makes our AFM systems the most cost effective ultra-high precision SPM platform.
The AFM systems can be equipped with different type of nanopositioning systems including flexure scanning stages in order to guarantee high planarity for customers interested in large area AFM measurements.
For example the A100-AFM is equipped with a closed loop sample positioning system. It guarantees absolute positioning with an accuracy of 10 nm (up to ten times better than closed loop AFM in the market). This particular feature, together with the specific A.P.E. Research software tool, makes the instrument suitable for nano-lithography.
The A100-AFM SGS is equipped with a flexure scanning stage that guarantees high planarity for customers interested in large area AFM measurements (up to 100 mm).
The modular structure allows the user to select and continuously improve the selected set-up according to the personal specific demands. A.P.E. Research has developed additional AFM tools for specific measurements modes (EFM, MFM, STM, Phase Imaging, CAFM, etc...). Other tools are developed upon customer requests or in a joint collaboration with Italian research institutions.
Other tools are developed upon customer requests or in a joint collaboration with Italian research institutions.